Advanced Facility for Microscopy and Microanalysis
Facilities Services - Bengaluru, Karnataka, India
Advanced Facility for Microscopy and Microanalysis Employees
Advanced Facility for Microscopy and Microanalysis Details
The Advanced Facility for Electron Microscopy and Microanalysis (AFMM) combines instruments and capabilities that provide options for characterization of structure and chemistry at various length scales from millimeters down to single atoms in correlative modes enabling researchers to address key problems in the physical sciences and engineering.Its genesis lay in an initiative by what was then the Department of Metallurgy to bring together a cluster of sophisticated characterisation tools starting with the SIRION scanning electron microscope , an e-beam writer and a focussed-ion-beam (FIB) followed by a transmission electron microscope (TEM), supported by the Department of Science and Technology, CSIR and the Indian Institute of Science itself. These were set up in a new complex under the Institute Nanoscience Initiative (INI). As more instrumentation and operational capability was added with support from IISc , DRDO , CSIR and DST, and DAE, the centre gradually morphed into what is today the Advanced Facility of Electron Microscopy and Microanalysis (AFMM) that includes additional high resolution advanced microscopy techniques such as aberration-corrected scanning transmission electron microscope, atom probe tomography, X-ray tomography etc.The centre is run by a core group of experts drawn from the faculty of various departments and aims to facilitate interaction with the faculty of the Indian Institute of Science in supporting characterisation approaches for their research, training generations of students and researchers in the capability that the centre offers, and offers solutions and collaboration to national R&D laboratories and industry and an international user base.
