Electronics - San Diego, CA, US
Filmetrics features a complete line of affordable UV to NIR spectrometer systems for measuring thin film thickness from 1nm to 13mm, optical constants, and deposition rates of thin films. For applications requiring measurement of sub-nanometer surface roughness and/or precision step heights, Filmetrics offers the Profilm3D – an easy-to-use, full-featured profilometer at a fraction of the cost of competitive systems.
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