NanoElectronic Imaging, Inc.
Nanotechnology - Los Angeles, California, United States
NanoElectronic Imaging, Inc. Employees
NanoElectronic Imaging, Inc. Senior Management
NanoElectronic Imaging, Inc. Details
NEI's Scanning TEM Electron Beam-Induced Current (STEM EBIC) imaging system has produced several best-in-the-world results in quantitatively mapping temperature, conductivity, potential, electric field, and work function. Few alternatives can map any of these properties at high resolution, and none can map them all. Standard TEM imaging only identifies where the atoms are in an electronic device – NEI's technology shows what they are doing.Our STEM EBIC system will be available starting in 2022, get the brochure here:https://drive.google.com/file/d/1Wc6PzbAZzfi_iBauPh-uNyHRRjHpoBWA/view?usp=sharingAnd visit our YouTube channel for more information about what our system can do:https://www.youtube.com/channel/UCvIf5oomH4uNlsjTQhrvC3g
NanoElectronic Imaging, Inc. Technologies
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