Electronics - Tallahassee, FL, US
Parallax Research develops and manufactures x-ray optics, components, WDS and EDS x-ray microanalysis spectrometers. They are used with SEM, TEM, FESEM, Electron Probe, Scanning Auger, high energy ports, and in stand-alone XRF. We also specialize in light elements and low energy x-ray analysis. Parallax designed and patented the Parallel Beam WDS (Wavelength Dispersive Spectrometer) and licensed it to major vendors- so you may have already seen our technology. Our spectrometers and components are available directly to you, at remarkable prices.