Publishing - Norwood, Massachusetts, United States
Signal Integrity Journal (SIJ), a sister publication to Microwave Journal, covers signal integrity, power integrity and EMC/EMI related topics with industry news, technical articles, white papers, products, Buyer's Guide, webinars, videos and more. SI Journal is the only peer reviewed, industry journal covering these markets. It began as a website, www.signalintegrityjournal.com, and added the publication of a magazine in 2017. A distinguished Editorial Advisory Board (EAB), https://www.signalintegrityjournal.com/articles/651-sij-editorial-advisory-board assists the editorial staff in the article review process and generation of quality content.Editor:Janine Love, Editor and EDI CON Technical Program DirectorTechnical Editor:Eric Bogatin, Professor, University of Colorado, Boulder in the ECEE dept and Teledyne LeCroy FellowContributing Editor:Patrick Hindle, Editorial Director at Microwave JournalEditorial Advisory Board (EAB):Rula Bakleh, Graphcore, Inc.Jay Diepenbrock, SI/RF ConsultantVladimir Dmitriev-Zdorov, Mentor GraphicsJason Ellison, Amphenol Barry Katz, MathWorksCathy Liu, BroadcomAlfred Neves, Wildriver TechnologyIstvan Novak, SamtecSteve Sandler, PicotestYuriy Shlepnev, Simberian Inc.Bert Simonovich, LAMSIM EnterprisesStephen Slater, Keysight TechnologiesLarry Smith, MicronMichael Violette, Washington LaboratoriesLearn more here: https://www.signalintegrityjournal.com/aboutus
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