Manufactures Mask and Wafer Inspection SystemsMasks:PDS 1020-G2Simultaneous Dual Sided InspectionSmall footprintStand alone unit or integrate into any systemParticle detection sub micron to 100+ micron/menu drivenPhase shift masksGo No Go inspection for stockers/cleanersPost inspection analysis software for detailed defect reviewDefect classifications such as Particles; scratches; haze; .......MTBF 10+ YearsNo PMsRemote diagnostics / repairsWafers:Using the PDS 1020-G2 platform we have adapted the tool for wafer inspection offering a low cost option to the KLA-Tencor Surfscan series toolsSub micron particle detectionStand aloneAutomatedIntegrated into any systemMTBF 10+ YearsNo PMsremote diagnostics / repairsWIS, Inc. continues to offer support for:Semiconductor Metrology Legacy tool supportSpecializing in KLA-Tencor systemsApplicationsHardwareOpticsRoboticsNIST Cal standardsNew and retubed lasersReplacement lampsNIST PSL Calibration standardsService On DemandFull time engieers availablePM contractsDe-installationInstallationTechnical supportRefurbishmentUpgrdaesSpares